Dissertation 

About 175 item dissertation in line with testability query results,the following is 1 to 50(Search took 0.033 seconds)

  1. The Implementation of DFT for a High-performance Processor,WangDan/National University of Defense Science and Technology,0/24
  2. Research of Scan Chain Inserting and Test Wrapper Installing in IP Core Design for Testability,JiangYueMing/Harbin University of Science and Technology,0/6
  3. Research on System Level Fault Diagnosis and Testability Analysis Techniques for Civil Aircraft,ZhangRong/Nanjing University of Aeronautics and Astronautics,0/14
  4. Research on China’s Currency Policy: How to Choose the Intermediate Target,FuXiaoLin/Shihezi University,0/0
  5. Research on Testability Modeling and Analysis of System Based on Modelica,ZhangSiWen/Harbin Institute of Technology,0/0
  6. Research on Embedded Software Testability,ZhangLiNa/Inner Mongolia University,0/85
  7. Modeling, Analysis and Software Design for System Testability Based on Multi-signal Flow Graph,DingZuo/Harbin Institute of Technology,0/3
  8. Design and Realization of System Testability Modeling Software Based on GDI+,WangZhengJie/University of Electronic Science and Technology,0/8
  9. Low-cost and-power Test for Digital Circuits,WangWeiZheng/Hunan University,0/94
  10. Application of Folding Counters in SoC Test,LiZuo/Hefei University of Technology,0/6
  11. Research and Implementation the Technology of Processing PCB Data in Automatic Test System,JiangWei/University of North,0/24
  12. A Low-Cost Delay Testing Methodology Based on Scan Chain Disabling Technique,WangZeCheng/Hunan University,0/6
  13. Research on Low Cost Test Method for RTL Data Path under Power Constraints,TianBin/Hunan University,0/3
  14. The Research on Test Pattern Generator Based on Self-feedback,GuoMiaoMiao/Hunan University,0/22
  15. Integrated Circuit Low-power Design-for-testability Analysis and Implementation,HuangLuHui/University of Electronic Science and Technology,0/18
  16. The Test of Part-BS Circuit and the Test Point Optimization,DuYanFeng/Hubei University of Technology,0/59
  17. Design and Reserch on640×512Uncooled Infrared Focal Plane Array Readout Circuit,DuYiYing/University of Electronic Science and Technology,0/22
  18. Research on Multi-Fault Test Generation Algorithms and Design for Testability of Digital Integrated Circuits,WuLiHua/Harbin University of Science and Technology,2/567
  19. Study on Fault Diagnosis & Testability in Analog Circuits Based on Time-Frequency-Domain Analysis and Neural Network,YuanHaiYing/University of Electronic Science and Technology,8/1139
  20. Architecture of Design-For-Testability and Its Optimization for System-On-Chip,WangYongSheng/Harbin Institute of Technology,6/766
  21. The Research on Low Power Built-in Self-test Design,LiRui/Southeast University,4/590
  22. Studies on the Stability of Integrated Current Mode DC-DC Converters Focused on PVTL Variations,WangHongYi/Xi'an University of Electronic Science and Technology,5/312
  23. Low Power MP3 Decoder and Its Design-for-Testability Techniques,ZhouJinFeng/Institute of Computing Technology,5/484
  24. Study on Fault Diagnosis in Analog Circuits Based on Neural Networks,WangCheng/University of Electronic Science and Technology,61/1986
  25. Research on the Design Optimization Techniques for System-On-Chip Testing,ZhangHong/Xi'an University of Electronic Science and Technology,7/744
  26. Study on Built-In Self-Test Methodology for Fault Diagnosis of Mixed-Signal Circuits,SunXiuBin/University of Electronic Science and Technology,3/807
  27. Research on Design and Test of Motor Control Digital Signal Processor,YanWei/Shanghai University,0/712
  28. Research on Design for Testability Based on the Framework of SOC,XuLei/Tsinghua University,5/772
  29. Research on the Realization of the Channel Receiving Chip in Cable DTV,XuYuanXin/Zhejiang University,1/437
  30. Research and Design of High Performance Digital Signal Processor,LiTao/Northwestern Polytechnical University,3/765
  31. Industrial Process Monitoring:An Approach Based on Wavelets and Statistics,WangHaiQing/Zhejiang University,11/717
  32. Path Delay Fault Testing for Arithmetic Circuits,YangDeCai/University of Electronic Science and Technology,1/189
  33. Research on Accumulator-Based Built-In Self-Test for DSP Data Path,XiaoJiXue/University of Electronic Science and Technology,0/261
  34. Grounding Grids Corrosion Diagnosis Based on Hierarchical Simplification Model,WangShuQi/Xi'an University of Science and Technology,2/151
  35. Investigations on Algorithms and Testability of Grounding Grids Corrosion Diagnosis and Their Applications,WangJianXin/Xi'an University of Science and Technology,0/224
  36. Research on Algorithms of Test Pattern Generation for Digital Integrated Circuits,HouYanLi/Harbin Engineering University,2/277
  37. The Research on Reconfigurable SoC DFT Structure and TLB Test Scheduling Strategy,ZhangJinYi/Shanghai University,0/221
  38. Optimization Technology of Design for Diagnostic Strategy Based on Dependency Model,YangPeng/National University of Defense Science and Technology,19/459
  39. Study on Testability for Electronic System Based on Particle Swarm Optimization Algorithm,JiangRongHua/University of Electronic Science and Technology,7/660
  40. Research on Testability and Low Power Design Method in VLSI High-Level Synthesis,SunQiang/Harbin Engineering University,0/333
  41. Research on High Level Synthesis Based on PSA and Finite Field Theory,WangGuanJun/Harbin Engineering University,0/78
  42. Research on Test Points Selection for Analog Fault Dictionary Techniques,YangChengLin/University of Electronic Science and Technology,0/133
  43. Built-in Self Test Technology of Electronic Systems,ZhuMin/Harbin Institute of Technology,0/176
  44. Research on Optimization Design and Integrated Evaluation of Testability Verification Test for Equipments,LiTianMei/National University of Defense Science and Technology,0/250
  45. Study and Design of Binary and Ternary Circuits Based on the Resonant Tunneling Device RTD,LinMi/Zhejiang University,0/113
  46. Research on Design for Testability and Test Techniques of Network-on-Chip System,ZhaoJianWu/University of Electronic Science and Technology,1/202
  47. Research of a BIST Scheme Using Test Patterns Applied by Circuit-under-Test Itself,OuYangXiong/Hunan University,2/101
  48. Research on ATPG Based on Test Vectors Applied by Circuit-under-Test Itself,LiuQin/Hunan University,2/122
  49. The Researches on Mixed-Signal Test and Design for Testability,PangWeiQu/Hunan University,2/266
  50. Investigation on the Corrosion Diagnosis Approaches of Grounding Grids,LiZhiZhong/Xi'an University of Science and Technology,5/112

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