Dissertation 

About 59 item dissertation in line with test generation query results,the following is 1 to 50(Search took 0.038 seconds)

  1. Research on Automatic of Software Testing Based on Models,XiaoChunYan/Jiangnan University,1/153
  2. Study on the Application of Formal Method in Component-based Real-time System,XiLin/Zhengzhou University,1/180
  3. Research on Test TEchnology of VLSI,LiuZuoKun/Harbin University of Science and Technology,0/90
  4. Research on Pattern Grouping and Pattern Selection Methods for Small-Delay Test,PiXiaoLin/Hunan University,0/10
  5. Research on Multi-Fault Test Generation Algorithms and Design for Testability of Digital Integrated Circuits,WuLiHua/Harbin University of Science and Technology,2/567
  6. Research on Distributed Protocol Interoperability Testing Based on Formal Methods,WangZhiLiang/Tsinghua University,5/345
  7. Research and Practice on Mobile IPv6 Protocol Testing,ZhangYuJun/Institute of Computing Technology,5/603
  8. Research on RTL Fault Models and Test Generation,YangXiuTao/Institute of Computing Technology,1/370
  9. Study on Chaos Control and Chaotic Optimization with Its Applications in Test Generation for Combinational Logic Circuits,KangBo/University of Electronic Science and Technology,7/438
  10. Research of Parallel ATPG Algorithm and Prototype System Design,LiuPengXia/National University of Defense Science and Technology,0/210
  11. Research on Algorithms of Test Pattern Generation for Digital Integrated Circuits,HouYanLi/Harbin Engineering University,2/277
  12. Demand-driven Automated Test Generation for Software Security Defects,ChengShaoYin/University of Science and Technology of China,1/499
  13. Dynamic Testcase Generation Based Automatic Defect Mining for Binaries,LiGen/National University of Defense Science and Technology,3/164
  14. Research on Test Generation and Fault Diagnosis for Analog Circuits,LongZuo/University of Electronic Science and Technology,0/61
  15. FSM-Based Test Cases Generation and Test Optimization,LiuPan/Shanghai University,0/325
  16. Research of a BIST Scheme Using Test Patterns Applied by Circuit-under-Test Itself,OuYangXiong/Hunan University,2/101
  17. Research on ATPG Based on Test Vectors Applied by Circuit-under-Test Itself,LiuQin/Hunan University,2/122
  18. The Research on Test Generation Algorithms of Multi-Fault and Design for Testability of Integrated Circuits,XiangFuJia/Harbin University of Science and Technology,0/241
  19. Research of Test Generation Algorithm of Three-Valued Neural Networks Based on the Genetic Algorithm,WangZuo/Harbin University of Science and Technology,0/85
  20. Research on Circuit Fault Diagnosis and Low-Power Test,QiuHang/Nanjing University of Aeronautics and Astronautics,2/307
  21. Research on High-level Test Generation Algorithm for VLSI,ZhuLi/Huaqiao University,0/64
  22. Research on Test Generation Algorithm for Delay Fault and IDDT Test Experiment,CaiShuo/Hunan University,0/58
  23. Generation and Implementation of NEMO Protocol Conformance Test,DuNing/Hunan University,0/153
  24. Conformance Test Study of Mobile IPv6 Protocol,BaiRuiFeng/Inner Mongolia University,1/80
  25. The Research on At-Speed Current Testing Method,NiuXiaoYan/Hunan University,4/54
  26. The Design for Testability and the Circuit of DSPC50,ZhuXiaoLi/Hunan University,4/107
  27. Transient current test generation and fault simulation,WeiXiaoFen/Hunan University,8/103
  28. The Research of Test Generation Method for Combinational Circuits Based on Binary Decision Diagrams,MouYi/Hefei University of Technology,0/110
  29. Based on the analysis of low -power design adventure and test - based design verification,LiuGuoHua/Institute of Computing Technology,0/76
  30. Conformance Testing for Neighbor Discovery in IPv6,SunJingBo/Institute of Computing Technology,4/161
  31. Research of the Test Generation Algorithm for the Combinational Circuit,YuHongJuan/Harbin University of Science and Technology,2/208
  32. The Application and Research of BDD to Combinational Circuits Test,LiuXinHui/Harbin Engineering University,0/85
  33. Research on the Test Generation of Digital Integrated Circuits Based on PSO,HouYanLi/Harbin Engineering University,1/153
  34. The Research of Fault Simulator for IDDT Testing,LiJie/Hunan University,0/63
  35. Design and Implementation of Boundary-Scan Test System,XuJianJie/National University of Defense Science and Technology,6/451
  36. Methods for Enhancing the ATPG Efficiency of Dynamic Current Testing and At-Speed Current Testing Simulation,ZhangZuo/Hunan University,3/57
  37. Research on Memery Test Technologies and It’s Application in Quality Testing,ZhangBiChao/Sichuan University,3/147
  38. Research of the Test Generation Algorithm for the Digital Integrated Circuit,ZhaoYing/Harbin University of Science and Technology,3/387
  39. Based on current IC Fault Diagnosis,ZhangLan/University of Electronic Science and Technology,2/186
  40. Research of IDDT ATPG Algorithm Based on Ambiguous Delay Assignments and BIST Test Pattern Generator Design,WangZuo/Hunan University,11/102
  41. RTL description of a combinational circuit automatic test generation technology research,ChenZuo/Hunan University,0/145
  42. Produce algorithm research based on the the of the layered testing of the the large-scale RTL a combination of circuit of the function module,HuangXiaoZuo/Hunan University,1/83
  43. Research on Boundary-scan Test Technique of Electronic Function Module,QiLiBin/Harbin University of Science and Technology,3/140
  44. Conformance Testing Study of Mobile IPv6 Protocol Based on TTCN-3,LiuJing/Inner Mongolia University,0/170
  45. Testing and Diagnosis of Bridging Faults in Combinational Circuits,LiZuo/Zhejiang University,0/70
  46. Research on Test Generation of Digital Integrated Circuits Based on ACA and PSO,WangYu/Harbin Engineering University,3/154
  47. Ontology-based Test Generation and Mutation Testing on Web Services,LiShuFang/Tsinghua University,0/213
  48. A Response Compactor Based on Extended Compatibilities Scan Tree Construction,HuangJieDi/Hunan University,2/18
  49. The Research and Implementation Test Generation Based on Genetic Algorithm Using FPGA,ZhongRuGang/Hunan University,5/112
  50. Based on Genetic Algorithm Approach to build self-feedback test,XiaoZuo/Hunan University,6/55

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