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Phosphorus-doped nanocrystalline silicon thin films and related characteristics of
Author: LiuXuWei
Tutor: ZuoXiaoYong
School: Zhengzhou University
Course: Optics
Keywords: Solar cells Plasma enhanced chemical vapor deposition ( PECVD ) Nanocrystalline silicon thin film Magnetron sputtering Silver oxide film
CLC: O484
Type: Master's thesis
Year: 2007
Downloads: 193
Quote: 2
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Abstract
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Several methods of thin film material was prepared in the most mature technology, relatively simple to operate a plasma-enhanced chemical vapor deposition (PECVD), and can be prepared by a large area thin film of high uniformity. But by PECVD deposition of high quality polycrystalline silicon thin film still must clarify two issues: First film microstructural characterization; film transport properties. The micro-structure and transport properties of the film to determine the performance of the battery, so the preparation of high-quality films are key to the production of solar cells. To solve these problems, researchers have multiple dedicated to the optimization of the deposition conditions and some auxiliary means. PECVD method, crystalline silicon thin film crystallization rate of the tax collectors and taxpayers, the average grain size of the substrate temperature, silane concentration studied, results nanocrystalline silicon thin films were prepared to study phosphorus doping on nanocrystalline the rate of crystallization of silicon thin film conductivity, the average grain size, lattice distortion and optical band gap of the film growth model and quantum dot tunneling model a reasonable explanation. The results showed that: (1) of the crystalline silicon thin film, of the present NANOFILTRATION silane concentration, the lower, the better the inflection point temperature of crystallization, the crystallization rate is lower; average grain size, crystallization rate with increasing temperature of the substrate having a similar variation (2) influencing factors of phosphorus-doped N-type nanocrystalline silicon thin film conductivity both free carrier concentration and mobility, while the dominant factors that affect the intrinsic nanometer silicon conductivity carrier mobility , the concentration of free carriers have limited impact. Doped with a small amount of phosphorus will promote crystallization and enhance conductivity; cause excessive phosphorus-doped lattice distortion, is not conducive to the crystallization rate and electrical conductivity increased. The experimental results are available quantum dots tunnel wear (HQD) model is a reasonable explanation. (3) silicon thin film of nanocrystalline silicon grain distribution was disordered state, there is no particular preferred orientation distribution; the smaller the grain size, the larger the lattice distortion caused by the reason is that the smaller the grain size, the surface of the additional pressure The larger the larger the grain distortion. (4) the nanocrystalline silicon thin film of the optical band gap E opt and the micro-structure of the crystal is closely related to the dopant concentration is low, E opt reduced, doping concentration higher, E opt increases. (5) reactive magnetron sputtering silver oxide film, oxygen, argon contribute to the oxidation of silver increased up to 2:1 when silver will complete oxidation. And accordingly drawn: the mask-to-noise ratio of the oxygen-argon ratio of 2:1 under the conditions of silver oxide prepared.
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CLC: > Mathematical sciences and chemical > Physics > Solid State Physics > Thin Film Physics
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