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The Design of Soft-core in Special Dynamic Testing System

Author: PeiFeng
Tutor: ZhangZhiJie
School: University of North
Course: Measuring Technology and Instruments
Keywords: Dynamic testing Soft-core FPGA Wireless
Type: Master's thesis
Year: 2013
Downloads: 14
Quote: 0
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With the rapid development of integrated circuits, due to the character of reusability, IPsoft provided a kind of design flow with high efficiency and low cost, so it has been widelyused in almost every area. However, soft-core which is oriented to dynamic testing system is arare abnormality. Aiming at this phenomenon, Design of common control soft for dynamictesting system is presented.Firstly, the paper analyzes the characteristics of dynamic test and testing process, andthen it gives the structure diagram of typical test system. The basic functional modules of testsystem are divided from system chart. It included A/D converter control, the trigger andnegative delay, the storage control, and communication control and so on. Aiming at all kindsof functions´╝îwork out AD control soft-core, trigger and negative delay control soft-core, USBcommunication control soft-core serial communication control soft-core by ISE, then simulatethem for functional verification. The IP cores has the ability of flexible programming´╝îaccording to different needs of test, it can changes their parameters, the system can bedesigned rapidly by simple modification and connection, the IP cores has good universal andtransplantable.In order to explain the application of soft-core in test system, a wireless storage testingsystem of shock wave was designed after all modules of soft-core were designed. Thesoft-core was transplanted to FPGA for control after hardware platform was built. Then theentire test system was completed by connecting each module. The accuracy of the systemfunction was verified through on-site testing. Not only explain the good application of thedesigned soft-core in the field of dynamic testing, also lay a foundation for the application ofSOC technology in the field of dynamic testing.

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > LSI,ultra LSI
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