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The Research of TFT-LCD Spot Defect Inspection System Based on Machine Vision

Author: FengXiaoBo
Tutor: LiRongYu; DingChenLong
School: Shanghai Jiaotong University
Course: Electronics and Communication Engineering
Keywords: Machine vision TFT-LCD Spot defect
CLC: TP274
Type: Master's thesis
Year: 2012
Downloads: 143
Quote: 0
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Abstract


As the current mainstream device of flat panel display (FPD), the thin film transistor–liquid crystal display (TFT-LCD) is very popular with customers for many advantagessuch as light and thin, low power, low radiation, high resolution. But due to TFT-LCDbelonging to the industry of high precision technology and high material cost, withcomplex production process and extremely high technological requirements, variety ofdisplay defects, especially the most common spot defect is easy to come into being in themanufacture process.As the necessary measure to enhance the product quality and reduce the costs, theTFT-LCD spot defect inspection technology is very important. Currently, how to achievethe high speed automatic inspection of TFT-LCD spot defect on production line is the oneof important subjects in TFT-LCD production research.This paper bring forward a TFT-LCD spot defect inspection method based onmachine vision technology as well as designing and constructing a TFT-LCD spot defectinspection system integrated with machine vision and digital image technology accordingto the above method. On the basis of acquiring the high quality image of TFT-LCD withthe consideration of the characteristics of spot defect, this system achieved the purpose offast and accurate inspection of TFT-LCD spot defect finally.For hardware system, the image acquisition device has been designed which includesthe zoom lens, area array CCD, frame grabber and3D motion platform. For softwaresystem, image identifying and processing technology have been comprehensively applied,such as image enhancement, image segmentation, edge extraction, etc. The softwaresystem with real-time acquisition, image processing and spot defect character identificationhas been developed based on Visual C++IDE. By experimental inspection of typical spotdefect on TFT-LCD, the satisfactory experimental result has been obtained, and thefoundation has been laid for researching the faster, more reliability inspection technologyin the future.

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