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Stacked chip scale package package -induced thermal stress simulation and analysis

Author: QianFeng
Tutor: ChengXiuLan
School: Shanghai Jiaotong University
Course: Microelectronics and Solid State Electronics
Keywords: Stacked chip scale package Package thermal stress induced Finite Element Method Structural factors Material factors
CLC: TN405
Type: Master's thesis
Year: 2007
Downloads: 41
Quote: 0
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Abstract


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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Manufacturing process
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