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LCD TV products as the research object , the products developed on the basis of similar products in the market failure analysis study of the reliability of the test method , aimed at product reliability indicators , the establishment of a system , reasonable LCD TV products developed by the accelerated life test program in order to better control the quality of the products developed . Reliability study of the history of the development and the reliability of domestic and international development status , the reliability of the study 's main content development as well as household appliances reliability . Use of industrial engineering methods , statistical analysis of failure of LCD TV products on the market , combined with the reliability of the status quo of the company's products , the establishment of the reliability of the fault tree of the LCD TV , provide the basis for its reliability experimental design . In order to verify the feasibility and rationality of the the acceleration test program design , test divided into two groups simultaneously. A group of the life test was carried out under the normal stress , another group of the life test is conducted under accelerated stress , the former test is carried out for validation of the latter . Normal stress tests and accelerated life testing in addition to test stress , exactly the same : the samples taken from the same batch of products , test procedures and failure criteria are the same , and thus , in theory, each set of test samples, the same type of life distribution . Accelerated life test temperature acceleration factor , while taking advantage of the end of the Type II Censored test . The Arrhenius acceleration statistical model , first assume that the product exponentially or Weibull life distribution , exponential distribution test and Weibull distribution test in accordance with the test data . The experimental data were used to point estimation and interval estimation method for processing. Extrapolation of the normal stress accelerated life test data processing , reliability lifetime value , then the normal stress test data and compared to verify that the accelerated test plans are feasible .
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