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Study of DC Bias Technology Based on Infrared Focal Plane Arrays Measurement

Author: ZhangGuoChen
Tutor: WangChangMing
School: Xi'an University of Electronic Science and Technology
Course: Systems Engineering
Keywords: Infrared focal plane arrays DC bias Noise Analysis
CLC: TN215
Type: Master's thesis
Year: 2011
Downloads: 43
Quote: 0
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Abstract


In recent years, with the development of infrared focal plane arrays (IRFPA) technology , the increasingly widespread use of infrared technology and systems in many areas of the military and the day - to - day production and life . In the context of this environment , the development of infrared focal plane array detector test system is very necessary, one of the key technologies of the system is the DC bias source to achieve , at home and abroad has not been possible in this key technologies substantial breakthrough. This article is around the DC bias source detector bias voltage is directly supplied to expand the research work . Mainly from the following aspects to carry out research work : a clear introduction of infrared focal plane arrays concepts, principles , and expounded the infrared focal plane array technology and development status , as well as at home and abroad in the infrared focal plane array test technically the level of research and gaps. 2 details the overall demand and overall structure of the main performance parameters of infrared focal plane arrays , as well as infrared focal plane array test system tests , the key technologies of the DC bias . 3. Detailed analysis of the theoretical analysis of the DC bias indicators impact test system for infrared focal plane . By the introduction of general electronic system noise and focal plane array detector noise , combined with practical work in the test environment and requirements of the key performance indicators of the DC bias source . DC bias source from the overall performance index , noise analysis , EMC technology and precision required to do a certain amount of discussion . From the actual needs of the DC bias circuit carefully design the hardware portion of the circuit and software communication part , some chips in circuit noise indicators and related algorithms simulation and analysis . 5 in the actual test results of application of the DC bias source is verified , and the correlation analysis . Summarizes some of the problems encountered during the test , the feasible improvement program .

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Photonics technology,laser technology > Infrared technology and equipment > Infrared detection,infrared detectors
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