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Bayes test equipment based on the loss of statistical reliability of the design verification test
Author: FengWenZhe
Tutor: LiuZuo
School: National University of Defense Science and Technology
Course: Control Science and Engineering
Keywords: Reliability Verification Test Design Test loss Two kinds of risk criteria Two types of risk
CLC: TJ06
Type: Master's thesis
Year: 2011
Downloads: 65
Quote: 0
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Abstract
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CLC: > Industrial Technology > Arms industry > General issues > Testing technology and facilities
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