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DM642-based infrared temperature measurement and image processing algorithms

Author: LanMengHua
Tutor: QianZuoSheng
School: Nanjing University of Technology and Engineering
Course: Physical Electronics
Keywords: Infrared Temperature DM642 Pseudo-color Emissivity Image Processing
CLC: TP391.41
Type: Master's thesis
Year: 2010
Downloads: 284
Quote: 2
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Abstract


Non-contact infrared temperature measurement technology eliminates the limitations of contactless temperature measurement , with a wide temperature range , can be used under high temperature and pressure environment , which is widely used in forest fire, electricity , border areas of testing. Meanwhile, with the continuous development of DSP technology , fast image processing feature allows DSP-based infrared temperature measurement technology become a research hotspot. This paper describes the principle of infrared radiation thermometry , elaborated infrared detection technology and the development of infrared temperature measurement technology , analyzes the typical characteristics of the infrared image and infrared temperature imaging technology , introduced and compared several commonly used method of temperature measurement . Build a complete infrared temperature measurement system, including infrared optical system, based on 384 × 288 infrared focal plane array thermal imaging front pretreatment system, based on the DM642 infrared temperature processing systems. Completed the hardware system set based on the realization of the infrared digital image processing . Prepared for BT.656 video format image capture and display algorithm , improved pseudo-color image enhancement algorithms to achieve a color gradient , the image information contained in the richer, can directly see the temperature distribution . Established a blackbody calibration and temperature measurement points required interface. In the blackbody calibration experiments , changing the distance between temperature recorded multiple sets of data , exploring temperature drift detector distance and the impact on measurement accuracy . Through the look-up table and two linear fitting method to establish a relationship between temperature and gray , and finally the emissivity correction , calibration, temperature display .

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CLC: > Industrial Technology > Automation technology,computer technology > Computing technology,computer technology > Computer applications > Information processing (information processing) > Pattern Recognition and devices > Image recognition device
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