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Development of the Breadth Wave Band Dielectric Film

Author: ChaJiaMing
Tutor: GaoZhiShan；ZhangBuSheng
School: Nanjing University of Technology and Engineering
Course: Optical Engineering
Keywords: Breadth wave band dielectric film Metal film Optical constant Deposition rate
CLC: O484.41
Type: Master's thesis
Year: 2007
Downloads: 50
Quote: 0
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Abstract


According to the effective demand of the breadth wave band dielectric film of the commander’s sight, the film characteristic matrix is used to analyze the dielectric film structure. It declares the impossibility of the film initial structure to be acted by all dielectric long (short) wavelength filter coating, and the necessary of adopting dielectric- nondielectric complex structure. We applied the concept of induced and optimized the film whose complex structure with metal as the main body by TFCalc optical thin film design software on the basis of the coating structure of the solar energy. During making process of the thin film, we adopted the measuring of high evaporate rate and low accumulate rate to make the optical constant and thickness of the very thin silver film get a valid control. Meanwhile auxiliary coating technology using ion beam improves the coating craft. Through several times of experiment, the breadth wave band dielectric film has been made basically to satisfy the function request of the product.With development of the breadth wave band dielectric film, some problems about the quality of the dielectric film - metal film - dielectric film structures are appearing, such as transmission areas to open widely deeply with the sacrifice the transmission rate and infrared reflectivity. At the same time its adaptability of the environment is not ideal and we need do further research.

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CLC: > Mathematical sciences and chemical > Physics > Solid State Physics > Thin Film Physics > The nature of the films > Optical Properties
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