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Research on TFT-LCD Micro Defect Detection Method Based on Image Processing Technology

Author: HeZhiGuang
Tutor: SuXiaoHong
School: Harbin Institute of Technology
Course: Computer Science and Technology
Keywords: Thin-film transistor liquid crystal display Defect Detection Poor shadow Image Registration Sub-pixel shift
CLC: TP274.4
Type: Master's thesis
Year: 2007
Downloads: 292
Quote: 2
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Abstract


And the conventional cathode ray tube (CRT, Cathode Ray Tube) display , thin film transistor liquid crystal display (TFT-LCD, Thin Film Transistor-Liquid Crystal Display) has a high resolution , high brightness , without geometric distortion , small volume, light and low power consumption , as a new generation of flat panel displays, it has a strong competitive advantage. LCD market price is the main factor affecting one of the LCD in order to reduce production costs and improve the yield of LCD , must develop efficient real-time defect detection technology. Thin-film transistor liquid crystal display production process includes hundreds of procedures , although the majority of TFT-LCD display production processes are done in a clean room , or inevitably some drawbacks. The vast majority of TFT-LCD defect detection is visible for the naked eye large defects , but much smaller than a display pixel for small defects can not be detected by these methods . Therefore, the micron defect detection algorithm has important significance. For existing thin-film transistor liquid crystal display automatic defect detection algorithms can only detect visible defects , can not detect invisible micron defect problems, we propose an image processing based on TFT-LCD micron defect detection algorithms. In order to achieve the resulting collection TFT-LCD glass substrate images with fast and accurate alignment of the template image , we propose a local image template matching based image registration methods, to achieve sub-pixel level, collected between the original image and the template image image registration . On this basis , based on the subtraction method and the proposed sub-pixel image registration TFT-LCD micron automatic defect detection algorithm TFT-LCD micron fast automatic defect detection . The method was applied to the actual TFT-LCD glass substrate defect detection equipment , the test results show that the proposed image processing based on TFT-LCD defect detection algorithm can accurately , quickly complete the TFT-LCD glass substrate micron defect detection tasks. This method Array district circuit undetected rate and false detection rate of less than 3% of the circuit Pad area undetected rate and false detection rate of less than 5% , to meet the requirements of the actual test .

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CLC: > Industrial Technology > Automation technology,computer technology > Automation technology and equipment > Automation systems > Data processing, data processing system > Centralized testing and roving detection system
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