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Research of Virtual Ultrasonic-testing System Based Onlabwindows/CVI

Author: LuYanFeng
Tutor: ShenXiaoHong
School: Beijing Technology and Business University
Course: Mechanical Manufacturing and Automation
Keywords: Ultrasonic-testing Virtual instruments LabWindows/CVI
CLC: TH878.2
Type: Master's thesis
Year: 2010
Downloads: 71
Quote: 0
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Abstract


Ultrasonic Testing is one of the most widely used method of non-destructive testing, which can detect flaws without affecting its structure, but most of the domestic products of ultrasonic detection are bounded by the complex hardware design, high cost, long development cycles ,inaccuracy and inefficiency, and difficulties of upgrade, whose designs are inflexible. To overcome those disadvantages, a type of virtual ultrasonic-testing system of high ratio of performance to cost is developed successfully. The paper used ultrasonic-testing technology, virtual instrument technology, electron and signal processing technology, in order to further integrity function of ultrasonic-testing instrument. The virtual ultrasonic-testing can not only finish collect, analysis and processing of ultrasonic signal at real time, but also finish A and C scan of ultrasonic-testing defect detector through controlling scan system by software, and defects locating, quantum, quality, and realize the picturization, intelligentization and automatization of ultrasonic-testing.The virtual ultrasonic-testing system adopts the structure of ultrasonic-testing card and virtual ultrasonic-testing system software, which has the advantage of simple structure, high ratio of performance to cost and mighty function. Ultrasonic-testing card Carried ultrasonic transmitter, receiver, processing and storage under the control of FPGA and then read and display the data of echo by application through the ISA bus. The software of the virtual ultrasonic-testing system is consisted of the device driver of the ultrasonic-testing card and the virtual ultrasonic-testing system application software. Using WinDriver to develop the card’s device driver can shorten the design cycle time and decrease the difficulty of the design. The application software is developed by the soft environment of LabWindows/CVI, which integrate a lot of controls and function library, it decrease the difficulty of the application software and enhance the flexibility of the user-interface .The experiments verify that the system is simple, user-friendly, stable performance, easy operation, and C scan greatly enhanced defect analysis capabilities, improve detection of automation and efficiency and it has a great value of application.

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CLC: > Industrial Technology > Machinery and Instrument Industry > Instruments, meters > Material testing machine and test equipment > Nondestructive flaw detector > Ultrasonic flaw detector
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