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Noise Used in Reliability Research of Semiconductor Device

Author: WangXueDan
Tutor: ShiJiaWei
School: Jilin University
Course: Microelectronics and Solid State Electronics
Keywords: Noise Semiconductor laser Bipolar transistor Reliability Annealing effect
CLC: TN303
Type: Master's thesis
Year: 2005
Downloads: 241
Quote: 0
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Abstract


This paper describes the mathematical basis of the noise and the semiconductor device , the basic electrical noise characteristics and noise for an electronic device reliability characterization methods , introduces noise measurement methods and test system . Noise theory and test system , to carry out a study of the relationship between and bipolar transistor electrical noise and process structure between the semiconductor laser low frequency electrical noise and device quality and reliability . Conductance number 808nmGaAs/GaAlAs high power quantum well lasers , low-frequency electrical noise measurements and electrical aging test , the lower part of the device after aging electrical noise , and the conductance of the number of tests but the degradation of the quality of display devices . The analysis showed that : certain aging conditions , 808nmGaAs/GaAlAs high power quantum well laser annealing effect , the poor quality of the device after aging electrical noise down . The decrease in noise before and after contrast the size of the initial noise and aging products eliminate early failure . Gr noise , burst noise , the aging process of the accelerating electrode , the noise signal , which may be a clear sign of the device degradation , and may be derived from the same defect source . Three bipolar transistors using different terminal technology to produce electrical noise test , concluded : covering the structure of terminal technology can control the device surface leakage current and reduce the electrical noise of the device to improve device reliability , this result the development of similar products , the production of the reference value.

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Semiconductor technology > General issues > Structure,the device
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