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Research on DEM Generation Using Three-Line Array CCD Lunar Image

Author: JiaBo
Tutor: JiangTing
School: PLA Information Engineering University
Course: Photogrammetry and Remote Sensing
Keywords: Three-line array CCD Lunar surface images Chang E One Laser altimeter Digital Elevation Model Planetary Data System SIFT algorithm
CLC: TP391.41
Type: Master's thesis
Year: 2010
Downloads: 103
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Abstract


Surveying and mapping the moon is one of the important scientific objectives of the lunar exploration mission , China 's lunar exploration satellite moon of Surveying and Mapping provides valuable data resources . This article is mainly for Chang E One satellite access to the three -line CCD lunar surface image data and laser height meter data , a preliminary study laser height meter data as control information to generate the lunar surface DEM 's thesis completed the main work is as follows : 1 , introduce the moon development of detection system of three-line array CCD image photogrammetric processing status quo . China Chang E One satellite payload of three-line array CCD stereo camera and laser altimeter works as well as data processing process is described in detail , and data storage format that the Planetary Data System (PDS) is described . 3, due to the moon image texture features is not obvious , and the image gray light impact obvious difference , This article is designed combination of three-dimensional images of the lunar surface based on SIFT and correlation coefficient matching method , and experimental research and analysis the experimental results show that this method is an effective three-dimensional images of the lunar surface matching method . 4, according to third-line array CCD image photographic measurement theory , the use of laser height meter data Select the appropriate control point on the front , downward-looking and rear view image photogrammetric processing moving surface intended to lawful conduct of DEM interpolation to generate rules grid network 's DEM and laser altimeter data as checkpoint internally interpolation accuracy for evaluation. Experimental results show that the elevation error of less than 3 pixels .

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CLC: > Industrial Technology > Automation technology,computer technology > Computing technology,computer technology > Computer applications > Information processing (information processing) > Pattern Recognition and devices > Image recognition device
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