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The Development of a Lampless Pen-Apparatus for Measuring Flaw Height on Radiography

Author: ZhangJie
Tutor: LiXiaoHongï¼›DingHui
School: Wuhan University
Course: Materials Processing Engineering
Keywords: X-ray negative flaw height measurement error revising reliability pen probe
CLC: TH878.1
Type: Master's thesis
Year: 2005
Downloads: 37
Quote: 0
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Abstract


The article discusses the importance of the model of flaw height measuring in the NDT, and the domestic and international tendency of present relevant subjects is summarizes. A new kind of measuring apparatus is put forward. This apparatus is lampless and it gathers the signal on ray negative of relevant position with pen-probe. Noise signal are eliminated and the height of defect is demonstrated directly through the model in micro controller. The apparatus is small, accurate, easy for operating.The most parts of the system are researched in this article. An appropriate photoelectric sensor is selected after careful comparison and an Optical Signal circuit is design base on it as well as a fit display is selected after a careful comparison and a display circuit is design base on it. A keyboard circuit is designed in this article likewise.Much work is done in this article to enhanced the resisting interfere ability. For improve the accuracy of the system, much work for revising error is done and the work is prove to be efficient according to the result of some experiments.A new pen probe is designed in this article when construct the integer system.This detector has a reason configuration that is convenience to fixing.An experiment for test the veracity is established in this article and the result of the test prove that this system arrives requirement in advance.

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CLC: > Industrial Technology > Machinery and Instrument Industry > Instruments, meters > Material testing machine and test equipment > Nondestructive flaw detector > Ray detector
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