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Research on 3D-Characterization of Surface Microtopography Based on GPS System

Author: ChenGuoQiang
Tutor: ZhangWeiQiang
School: Nanjing Agricultural College
Course: Mechanical Design and Theory
Keywords: GPS ( Geometrical Product Specification ) Surface morphology Surface functionalization Areal Characterization Atomic force microscopy (AFM)
CLC: TG84
Type: Master's thesis
Year: 2007
Downloads: 272
Quote: 1
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Abstract


Geometrical product specifications (GPS) is the basis of the most influential international standards and measurement of information systems, manufacturing information, quality management, industrial automation systems and integration work. GPS-based system, to carry out the basic research, practical conversion, and related standards and formulate practical significance. This paper describes the framework and the development of a new generation of GPS system dynamic summary of to analyze today at home and abroad on the surface morphology of the characterization and assessment of the status quo, pointed out that the surface morphology characterization and assessment is an important part of the GPS system. Universal standard based on the new generation of GPS matrix model, a systematic analysis of the two-dimensional morphology of the current GPS system characterization parameters and evaluation criteria, summarize and analyze the determination of the two-dimensional characterization of the midline law, MOTIF law and the corresponding two-dimensional assessment of baseline compare their advantages and disadvantages and application status. Research and development direction, the surface morphology of the three-dimensional characterization of today's international is still in the stage of research and exploration, the analysis of three-dimensional characterization study using a Gaussian filtering method to determine the mathematical model of the surface of the three-dimensional characterization of assessed datum detailed analysis and comparison of ISO / TC213 recently proposed the Areal characterization parameters and the EC proposed 143 parameter system, combined with the practical principles of GPS standard system to select a set of the Areal characterization parameter system, to established characterization parameters and surface properties of the corresponding relationship and exploratory proposed Characterization of the principles and methods of parameter selection. After the analysis of the surface morphology of the various measurement methods, explains the basic principle of the atomic force microscope (AFM), the use of AFM extracted two different machining accuracy the polishing surface topography information subjected to a surface weight, the surface morphology of the acquired information Frame and its filtering process to obtain the evaluation of the surface of the Gaussian datum corresponding Areal characterization parameter values, and comparison is calculated on this basis, the results show that the Areal amplitude parameter and the integrated parameter sensitive to the different reaction with the surface topography, the function parameter is relatively stable grinding workpiece surface morphology characteristics with the improvement of machining accuracy tends to a Gaussian distribution, precision grinding, surface morphology suitable for the use of Gaussian filtering analysis. The experiments also show that the atomic force microscope ideal for measuring finishing the surface of the three-dimensional surface morphology, an important measurement tool that can be used as a GPS System.

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CLC: > Industrial Technology > Metallurgy and Metal Craft > Tolerance techniques to measure and mechanical measuring instruments > The measurement of surface finish ( surface roughness ) and its meter
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