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Research and Design of Performance Test Platform for SD Card and CF Card
Author: ZhangGang
Tutor: PengJin
School: Wuhan Institute of Technology
Course: Control Engineering
Keywords: SD、CF high speed test PCI Express card high speed circuit
CLC: TN407
Type: Master's thesis
Year: 2013
Downloads: 2
Quote: 0
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Abstract
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With the development of modern science and technology and theprogress of production, the application of SD, CF card is more and moreextensive. SD, CF card performance is directly related to the safety andreliability of the ongoing life and production work. So the performance andtest of SD,CF card is very important. While the traditional approach to testand verify the SD card is mainly through the use of ordinary low speedreader. And then read and write test card by the read/write software.Although you can test out some of the basic functions, to high speedperformance test, you need a special card reader. General reader is difficultto meet high-speed and long time test, not to mention the demand ofproduction test. In view of the above two kinds of high-speed test card, ahigh speed performance test platform is discussed.The hardware structure based on PCI Express interface for high speedtesting and verification is mainly introduced in this article. The SD and CFcard are integrated into a PCI Express card, so that the two cards can betested at the same time. The different voltage modes of the hardware circuit,frequency characteristics and anti-interference characteristics are studiedand analyzed,too. The two cards’ read-write controllings were studied andthe framework of PCI Express and driver development are introduced. In thetest part, the two cards were tested with the designed platform, and throughthe analysis of the test data, we can find the usefulness of the PCI Expressboard.The platform can do high speed test on SD, CF card together in thewindows operating system and it also can make the complex testing in theordinary desktop PC. And the design of PCI Express card, can be used in theSD, CF card sampling test in the production and also do long time highspeed test by software.
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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Testing and inspection
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