TN407,Testing and inspection

About 488 item dissertation in line with TN407,Testing and inspection query results,the following is 1 to 50(Search took 0.051 seconds)

Functional Verification of YHFT-DX High Performance DSP,GaoWeiNa/National University of Defense Science and Technology,0/5
SOC Test Program Optimization for the High Efficiency,HeZuo/Shanghai Jiaotong University,0/7
The Acceleration Method Research for Small-delay Fault Simulation,HuJin/Hunan University,0/0
Research on On-line Detecting Methods of Faults Reside in Digital Circuits,WangJiYe/Harbin Institute of Technology,0/28
Research on Test Pattern Generation for Stuck-at-fault and Compression Algorithms,TaoLiZuo/Harbin Institute of Technology,0/24
0.18μm Logic Process Flow and Process Control Monitor,LiuYe/Tianjin University,0/0
The Verification of USIM Core Based on Specman,ZhangChuangHui/Xi'an University of Electronic Science and Technology,0/2
Design of Automatic Chip Test System Based on LabVIEW,JiangShi/Hubei University,0/14
The Research on Online Detection Technology of Aging and Soft Error for Digital Integrated Circuit,WangJing/Hefei University of Technology,0/26
Research on TSVs Test in3D-SICs,TangYong/Hefei University of Technology,0/46
The Research on Test Data Processing Technology for Concurrent Core Test Reusing NoC,HuangGuiLin/Hefei University of Technology,0/14
Research on Test Data Compression Coding Method for Integrated Circuit,MaHui/Hunan University,0/2
Research and Design of Automatic HIC Testing System,ZhangXianQi/Nanjing University of Technology and Engineering,0/12
Design of Portable RLC Measuring Instrument Based on FPGA,GaoKun/Jinan University,0/12
Research on Simulation Methods Based on GPU for Small Delay Faults,PengMingMing/Hunan University,0/1
Research on Small-delay Test Pattern Generation and the Method of the Critical Path Selection,WeiJianLong/Hunan University,0/0
The Design and Research of Automatic Test System Based on Audio Amplifier Circuit,ZhangShiFang/Hunan University,0/11
Research on Multifunction Detecting System for Printed Circuit Board,LiYaMing/Changchun University of Science and Technology,0/3
RF IC production test system and its calibration system development and Implementation,LiXinPeng/Jiangsu University of Science and Technology,0/5
Research on Prediction and Tolerance on Integrated-circuits Aging,XuHui/Hefei University of Technology,0/107
Design and Implementation of Leakage Protection Special Integrated Circuit Test System,LiuJun/University of Electronic Science and Technology,0/18
Research on Key Issues for Testing Network on Chip,OuYangYiMing/Hefei University of Technology,0/80
Research and Implementation of Chip Automatic Test Platform Based on FPGA,FangXueNan/South China University of Technology,0/16
Study of RF Chip Testing Technology Based on ATE,LuoQing/South China University of Technology,0/33
The Modeling and Design of Circuit Correctness Verification System,WangHongXuan/Jilin University,0/6
The Design and Implementation of Software System for Integrated Circuit Burn-in Test Equipment Based on Embedded Linux,ChenGuangHao/Hangzhou University of Electronic Science and Technology,0/2
Automated Test System of xDSL Aanalog Front-end Chip Based on Virtual Instrument,KeZhiSheng/South China University of Technology,0/9
Design and Numerical Analysis of Tem Cell Used for IC Radiated Emission Test,WenShuZuo/Jimei University,0/12
A Low-Cost Delay Testing Methodology Based on Scan Chain Disabling Technique,WangZeCheng/Hunan University,0/6
System-on-chip BIST Test Generation Technology Research and Application,ZhangHao/Hefei University of Technology,0/2
The Research on Timing Fault On-line Detection for Digital Integrated Circuit,LiZhiJie/Hefei University of Technology,0/3
Research on Visualization Methods of Boundary Scan Test Results,LiHeng/Hefei University of Technology,0/5
Co-simulation Based RTL Fault Behavior Research,SongJingKai/Harbin Institute of Technology,0/3
Research on the Design of Test Structure for Three Dimensional SoC and its Optimization,WangShuai/Harbin Institute of Technology,0/1
Research on IP Verification Technology Based on Verification Platform,LiHongWei/Harbin Institute of Technology,0/10
The Verification of Backlight Control IP Based on VMM,FanJianRong/Ocean University of China,0/3
A type of high frequency circuit design board equipment module testing equipment and Implementation,ZhouGuoXiang/Nanjing University of Technology and Engineering,0/2
Research and Design of Performance Test Platform for SD Card and CF Card,ZhangGang/Wuhan Institute of Technology,0/2
Programmable Logic Device Test System,XuYunHou/Yangtze University,0/0
A mixed motor drive chip testing technology development and Implementation,ZuoChenZuo/Fudan University,0/9
study the natural frequency of the stacked chip by experiment test,YanGuoZheng/Central South University,0/15
Research on the Algorithm of IC Test Vector Translation,LiJiuZhou/North China University of,0/3
The Chip Failure Analysis and Solution Caused by Crystal Lattice Dislocation Based on0.18um Technology Process,ZhouQian/Shanghai Jiaotong University,0/20
NAND Flash Card Low Cost Test Strategy Development and Implementation,QiuQingWu/Shanghai Jiaotong University,0/22
Realization of test technology with high speed interface circuit chip with low cost testing machine,LiKang/Fudan University,0/33
Design of the Testing System of Performance of the Pulse Magnetic Core,KongWeiPeng/Hangzhou University of Electronic Science and Technology,1/17
Embedded SRAM built in self test implementation,XuZhengYi/Fudan University,0/43
Research on Detection of High-Density Circuit Module Based on Electromagnetic Scanning Technology,WangZhongXu/Xi'an University of Electronic Science and Technology,0/3
Research on Low Cost Test Method for RTL Data Path under Power Constraints,TianBin/Hunan University,0/3
Research on Detection Method of Abnormal Frequency Point of High-density Board,ZhangZhen/Xi'an University of Electronic Science and Technology,0/7