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Conceptual Design of Material Emissivity Testing Based on Vacuum Environment

Author: WanYuZhu
Tutor: ZhouYanPing
School: Harbin Institute of Technology
Course: Optical Engineering
Keywords: Infrared radiation material Emissivity Space environment simulation Noise Analysis
CLC: TN219
Type: Master's thesis
Year: 2008
Downloads: 30
Quote: 0
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Abstract


Satellites play an increasingly important role in modern military and economic fields , satellite security is increasingly important as the space against the development of technology . Infrared radiation characteristics of the material by suppression technology has been a great deal of attention , thus becoming increasingly important measurement of the radiation characteristics of the material in the space . The main purpose of this study is to design a measurement system for the work space environment simulation chamber , to space materials, including metal-coated coating material infrared emission rate test . The paper focuses on the following: First, from the analysis of space environmental conditions , design the The the vacuum cold background simulation system to simulate the space environment , the research status of emissivity measurement method to analyze the advantages and disadvantages of the various methods of measurement , space environment simulation of indoor space material infrared emissivity measurement program . Requirements analysis , through the measurement of the sample and the and subsystems proposed indicators for measuring program . A sample and the blackbody temperature control program , the temperature control system performance requirements , calculated on the entire test liquid nitrogen consumption . By analysis of the function of each system , the program flowchart of the control system design. The combination of detector development at home and abroad , the optical system of technical indicators to analyze and determine the structure of the optical system , select a suitable optical material , the design results and evaluation of image quality . Technical requirements for the system , the design of the subsystems . The analysis of the advantages and disadvantages of various spectroscopic system , the design of the scanning system size and the choice of the substrate material . Document measured emissivity data , establish two emissivity and temperature model , analysis of each model suitable material ; actual measurement data provided by the two models calculated emission rate literature , the maximum error is less than 2 %. The analysis of a variety of noise component of the detector noise , the use of software simulation of the detector signal - to - noise ratio , and analysis of the main factors that cause the detector noise . The technical requirements for the system , using Planck 's law measurement program error analysis .

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Photonics technology,laser technology > Infrared technology and equipment > The application of infrared technology
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