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Researches on the Intellectualized Testing System of the Secondary Electron Emission Yield of Space Materials Based on PLC and Kingview

Author: ChenDaXin
Tutor: ChangTianHai
School: South China University of Technology
Course: Physical Electronics
Keywords: space materials secondary electron emission PLC Kingview Intelligent test control
CLC: O462.2
Type: Master's thesis
Year: 2010
Downloads: 200
Quote: 0
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Abstract


Secondary electron emission yield of space materials is an important parameter characterizing the charging state of spacecraft surface, it plays an important role on the prediction of spacecraft surface charged and the selection of anti-charged materials. To measure secondary electron emission characteristics of space materials, space research institutions have done some research and developed several generations of test system. Regrettably, the early test systems can not completely solve the problem of the charge accumulation on the surface of the material during test, leading to a large deviation between the test result and the theoretical value. In addition, there is no complete, intuitive HMI, the testing process is still manually operated by mechanical button. Miscellaneous experiment steps may bring much inconvenience, lead to errors and introduce security implications.The main purpose of this paper is to develop good universal, graphical test monitoring mechanisms to improve usability and security of the test system, so the intellectualized testing system of the secondary electron emission yield of space materials based on PLC And Kingview is designed. The system can not only provide an intuitive, straightforward images of the system components and state parameters of testing process, but also an easy click on the image button in the touch screen, we can also control related equipment and set process variables automatically by The monitoring process control system developed by our own . In addition, through improving the electron gun, electron collector and the target temperature control devices, testing accuracy of secondary electron emission characteristics of space materials has been greatly enhanced compared with the original test system.Besides, it is a given at the end of the paper that future research directions and improving suggestions on the testing system of the secondary electron emission yield of space materials. I believe greater research results will be achieved in the area of secondary electron emission yield accurate measurement in the near future.Above all, the research of the secondary electron emission yield of space materials testing skill is still in the primary stage in China. There is still a gap with foreign counterparts. I hope this paper can provide some references to researchers in this area and promote its further research in a way.

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CLC: > Mathematical sciences and chemical > Physics > Vacuum Electronics (Electronic Physics ) > Cathode electronics > Secondary electron emission,secondary electron emission cathode
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