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Dynamic characteristics of the PIN diode Computer Simulation Analysis and Research
Author: LiuXin
Tutor: GuanYanXia
School: Shenyang University of Technology
Course: Microelectronics and Solid State Electronics
Keywords: Avalanche breakdown Dynamic characteristic Reverse Recovery Time Softness factor
CLC: TN312.4
Type: Master's thesis
Year: 2012
Downloads: 118
Quote: 0
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Abstract
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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Semiconductor technology > Semiconductor diode > Diodes: structure and performance > PIN diode
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