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Image-based detection of manufacturing defects bearing sleeve
Author: ZhengLing
Tutor: ZhuShiQiang;JinBo
School: Zhejiang University
Course: Mechanical Engineering
Keywords: Embedded Systems Image Acquisition Bearing sleeve Chamfer Image Processing Defect Detection
CLC: TP274
Type: Master's thesis
Year: 2012
Downloads: 113
Quote: 0
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Abstract
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CLC: > Industrial Technology > Automation technology,computer technology > Automation technology and equipment > Automation systems > Data processing, data processing system
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