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MicroSD memory test methods

Author: ZhuWei
Tutor: YangLianXing
School: Fudan University
Course: Electronics and Communication Engineering
Keywords: MicroSD Flash Memory Fault model Test
CLC: TP333
Type: Master's thesis
Year: 2008
Downloads: 41
Quote: 0
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Abstract


Nowadays, the Flash Memory’s capacity and speed increase rapidly. Various new cell configurations have been developed. We need research how to test a Flash product fast and exactly. In this paper, at first, we reviewed the development of Flash and roughly learnt its current status. Then we began to study SanDisk company’s MicroSD cell and analyze its fault model. After studied the product MicroSD datasheet, we make a plan to test this product. We researched the test method and theory basing SuperFlash cell’s fault model. At last, We make a detailed test flow and test the product successfully. Two characteristic in this paper: 1. The test method depend on the invalidation theory during production 2. The test method has been applied in production and got a well result.

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CLC: > Industrial Technology > Automation technology,computer technology > Computing technology,computer technology > Electronic digital computer (not a continuous role in computer ) > Memory
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