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The Study on Hardware of Testing System for High Energy Electron Beam Quality

Author: TangJiMing
Tutor: WangKeHong；ZhouZuo
School: Nanjing University of Technology and Engineering
Course: Materials Processing Engineering
Keywords: Electron beam welding Energy density Faraday cage principle Sensing amplifier circuit High-speed acquisition
CLC: TP274
Type: Master's thesis
Year: 2009
Downloads: 59
Quote: 0
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Abstract


In this paper, the principle of the Faraday cup , collection of high-energy electron beam signal sensing , electromagnetic coil drive high-speed scanning of electron beam of the electron beam passes through the Faraday purpose of the hole , the electron beam energy density distribution law sensing . The design of the high voltage electron beam quality sensor detection system, capable of detecting the 60-150kV ,5-100mA of electron beam energy density distribution law , the system by the electron beam Faraday cup sensor means , the solenoid coils of the electron beam , electron beam high accuracy amplification circuits and high-speed data acquisition card and other components . The electron beam from the energy absorbing device scans to the Faraday cup for the X-direction deflection stepping on the Faraday cup Y direction deflection . Test Germany Aachen University developed a deflection coil based on the obtained relationship between the X and Y deflection direction of current and magnetic field , according to the scan path and the Y direction of the electron beam of 20 μm step distance , calculated from the pole piece 12 of deflection coils , each the pole shoe on the winding is 87 turns Wire designed to 0.27mm . Developed for the characteristics of the electron beam into the Faraday cup, the sensing signal is very weak , the sense amplifier circuit and a micro signal differential amplifier circuit , the two circuits having the characteristics of the multiples of the controllable amplifier , suitable for amplification of the weak signal . At the same time design the active low-pass filter circuit , using EWB to micro- signal differential amplifier circuit simulation . In accordance with the electron beam in the X-direction scanning frequency of 5KHz, collected 625 points in the X direction, the scanning process is complete a need in the scanning area of 2mm × 2mm , calculate the acquisition card of the required minimum sample rate is 25MHz . PCI-1714 high-speed data acquisition card to achieve 30MHz sampling rate and a resolution of 12 , it is possible to achieve high-speed , high-precision data acquisition functions .

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CLC: > Industrial Technology > Automation technology,computer technology > Automation technology and equipment > Automation systems > Data processing, data processing system
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