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The Investigation on EMI Measurement Method of Integrated Circuit

Author: LiuJianPeng
Tutor: LiuYuanAn
School: Beijing University of Posts and Telecommunications
Course: Electronics and Communication Engineering
Keywords: Integrated Circuit (IC) Electromagnetic Compatibility (EMC) Electromagnetic Interference (EMI) measurement method direct coupling method Workbench Faraday Cage method WFC
CLC: TN407
Type: Master's thesis
Year: 2008
Downloads: 200
Quote: 2
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Abstract


Along with development of integrated circuit (IC) industry, lots of attention are drawn to the Electromagnetic Compatibility (EMC) for IC, which is a pivotal part in electronic product. Electromagnetic Interference (EMI) from IC has important influence to EMC of electronic product. Studying the measurement method of IC EMI can effectively evaluate EMC of IC, improve design of EMC of IC, and guide how to choose appropriate IC.In this paper, the EMC test technology of integrated circuit was studied, focusing on the measurement method of IC EMI. Based on the comparison and analysis of a few common methods, the so-called direct coupling method and Workbench Faraday Cage (WFC) method were used to measure the electromagnetic interference of some tested chips.The main contribution of this thesis includes:a. Based on the analysis of IC EMI reasons, the measurement methods of IC EMI, 1Ω/150Ωdirect coupling method and Workbench Faraday Cage method, were investigated.b. In the article principle of measurement was analyzed, the composing of test system and requirements of test equipment were investigated. The appropriate test equipments were chosen and some facilities such as RF current probe, matching network and WFC were made, test system for IC EMI was built up and some IC samples were tested.c. The attentively problems during IC EMI test was investigated, including test conditions, operation mode, test set-up, test procedure and result evaluation, put forward test project for EMI measurement of IC.The test system and measurement methods could be used to evaluate the performance of IC, especially during research and development of IC, the effect of with and without EME suppression could be evaluated with the system and methods. On the other hand, the IC test can evaluate objectively EMI of different ICs.

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Testing and inspection
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