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Nanoscale in-Plane Deformation Studies Using Atomic Force Microscopy and Digital Image Correlation Techniques

Author: ZhangBoWen
Tutor: DongShen；ZuoYongDa
School: Harbin Institute of Technology
Course: Mechanical Manufacturing and Automation
Keywords: Digital image correlation method Atomic force microscopy Situ tensile
CLC: TG806
Type: Master's thesis
Year: 2010
Downloads: 68
Quote: 0
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Abstract


With the nanofabrication technology continues to evolve , the requirements for material microstructure mechanical properties and microstructure of the mechanical analysis continues to increase. When the micro - structural deformation surface displacement of only a micron size , the traditional mechanical sampling resolution and sensitivity of the experimental methods are difficult to meet the requirements. Therefore, the need to carry out research on micro-and nano -scale deformation . The microscopic deformation characteristics based on laboratory situ tensile testing device with atomic force microscopy ( Atomic Force Microscope , AFM ) , combined with digital image correlation method ( Digital Image Correlation , DIC ) , thus directly by the AFM image material quantitative analysis . First , for the evaluation of the feasibility of application of DIC , the anthropogenic DIC analysis of known deformable AFM image is spent comparing the calculated results , the DIC applied in-situ tensile test macro CCD microscope analysis of the mechanical characteristics of the welding member , evaluated the feasibility of DIC used in situ tensile tests . , In response to the AFM , the key components of the scanning clay pipes with scanning nonlinear characteristics and hysteresis effect, the scanning process will give DIC result in errors . Through the the AFM calibration process to reduce measurement error , and the error evaluation and analysis of the AFM scan parameters applicable in the analysis of the DIC . Finally , by the copper wire and tape -situ tensile test using AFM supported by a stretching process , the surface morphology , then DIC . The test results and data analysis indicates that the DIC method for mutations on the surface morphology observation, such as the falling off of the oxide layer . The use DIC Description creep tape stretching process , and analysis of the deformation of the surface of the sample in the stretching process .

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CLC: > Industrial Technology > Metallurgy and Metal Craft > Tolerance techniques to measure and mechanical measuring instruments > General issues > Technical methods of measurement
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