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CMOS process improve DRAM retention time research

Author: PanGuoHua
Tutor: ZhangWei
School: Fudan University
Course: Electronics and Communication Engineering
Keywords: DRAM
CLC: TN405
Type: Master's thesis
Year: 2008
Downloads: 70
Quote: 0
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Abstract


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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Manufacturing process
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