About 9 item dissertation in line with interface traps query results,the following is 1 to 50(Search took 0.078 seconds)
- Study on the Gate Leakage Current of Uitra-thin MOS Devices,HuShiGang/Xi'an University of Electronic Science and Technology,0/178
- The Characteristic Research of AlGaN/AlN/GaN Heterostructure Schottky Contacts,CaoZhiFang/Shandong University,0/147
- Electrical Characteristics and Reliability of MOSFET Capacitors with Ultra-thin Oxides,YANJU YU/Shanghai Institute of Microsystem and Information Technology Research Institute,0/104
- The Nano CMOS devices new methods of measurement and for reliability studies,LiuWenJun/Fudan University,0/207
- 0.13 micron logic Negative Bias Temperature Instability improvement,RenJiaDong/Shanghai Jiaotong University,1/42
- Study on Electrical Characteristics of MOSFETs with High-κ Gate Dielectric,LiuShiHong/Xi'an University of Electronic Science and Technology,0/96
- The Research on the Properties of SiC MOS Interface by Conductance Method,LiLinMao/Dalian University of Technology,0/91
- The Research of Hot-Carrier Effect and NBTI Effect on Ultra Thin Gate Oxide PMOS Device,ZhangTieNan/Tianjin University,0/45
- The Study of Hot Carrier Injection Effect in Sub-Micron MOS Devices,DuanXiaoBo/Tianjin University,0/57
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