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A Study in the Temperature and Time Effect of Low-e Glass in the Process of Heat Treatment

Author: ShaHeSong
Tutor: ZhaoHongLi
School: Yanshan University
Course: Materials Science
Keywords: Low-E films heat treatment SEM sheet resistance
CLC: TQ171.1
Type: Master's thesis
Year: 2012
Downloads: 53
Quote: 0
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Abstract


The temperature and time effect of two typical Low-E glass in the process of heattreatment were investigated in this paper. It reveals the evolution path of electro-opticalproperties, and then acquires the failure critical condition of the two materials. Themechanism of changes of the explanation is given.Silver-based Low-E films deposited by magnetron sputtering technology were heatedat500degrees on different holding time. FTO Low-E films deposited by chemical vapordeposition (CVD) were heated at different temperature on the same holding time. Thecrystal structure of the two kinds of films were analyzed by X-ray diffraction (XRD) andMicroscopes Raman Spectrometer; The surface appearances of the films were observedby Field emission scanning electronic microscopy(FESEM).The distribution of mainelements in the films were analyzed by Energy Disperse Spectroscopy(EDS)；The opticaland electrical properties were measured by UV-VIS spectrophotometer and physicalproperty measurement system (PPMS).The results show that the visible light transmittance of silver-based Low-E films firstincrease then reduce with the increasing holding time at the same temperature(500degrees). When the holding time reach20min, the visible light transmittance reachmaximum value78.2%. When the holding time reach50min, the visible lighttransmittance drop to64.4%. XRD and Raman spectrum analysis shows that, before heattreatment the function layer (Ag) of silver-based Low-E films is Ag simple substance.After heat treatment Ag oxide appear, and Ag oxidized phenomenon aggravate with theincreasing holding time. in addition，along with the increase of holding time, part area ofthe films appear crack and fall off.The main components of FTO Low-E films are SnO2and the crystal structure is rutiletype, it have preferred (110) orientation, and crystal structure becomes complete aftertempered. The SEM image show that surface of the films begin to appear crack at660degrees。At700degrees，the films crack phenomenon is very serious, film continuity isdestroyed. As the temper temperature increases, the sheet resistance of films increases too. When the temper temperature reaches640degrees, the sheet resistance of filmssignificantly increases for the first time, from63/□to144/□. When the temper-temperature reaches700degrees, the sheet resistance of films significantly increases forthe second time, from182/□to240/□. EDS spectrum analysis shows that with therise of heat treatment temperature, oxygen content in the film increase gradually. Heat-treatment can make the O in air diffusion into films to replace F or O vacancy, thus reducethe concentration of the O vacancy in film, and make the sheet resistance of filmsincrease.

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CLC: > Industrial Technology > Chemical Industry > Silicate > Glass Industry > Basic theory
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