Dissertation > Excellent graduate degree dissertation topics show

Design of Hybrid Integrated Circuit Test Hardware Circuit Test Board

Author: WangTianWei
Tutor: ZhanHuiQin
School: University of Electronic Science and Technology
Course: Measuring Technology and Instrument
Keywords: Hybrid integrated circuit test auto tester static parameters of the test test vectors
CLC: TN45
Type: Master's thesis
Year: 2013
Downloads: 43
Quote: 0
Read: Download Dissertation

Abstract


With the rapid development and progress of science and technology, hybridintegrated circuits (Hybrid Integrated Circuit,HIC) industry has made tremendousdevelopment. Hybrid integrated circuit testing is a major link in the IC industry chain,which ensure the design of the circuit to achieve the desired indicators. Hybridintegrated circuit test is a support technology in the IC industry,and the hybridintegrated circuit automatic test equipment (Automatic Test Equipment,ATE) is alsothe test essential equipment in conducting the IC verification.Therefore,to carry out thehybrid IC test technology research and development of automated test equipment is animportant job,It is necessary to shorten the gap in the industry with foreign country assoon as possible. Hybrid integrated circuit test equipment developed in this subject canpartly meet the need of the hybrid integrated circuit testing,and with the simple,inexpensive,very practical advantages,it can greatly improve the efficiency of the ICproduction and reduce production costs.The first chapter of this thesis describes the automatic test system of the hybridintegrated circuits and foreign development status,and analyzes the technical problemsfaced by the hybrid integrated circuit testing. The second chapter describes the basicknowledge involved in hybrid integrated circuit test board design,including theprinciple of hybrid integrated circuit testing, detailed description of the hybridintegrated circuit test method, the direct digital synthesis technology applications andtest vector generation technology.Chapters III and IV are the focus of this paper explain in detail the corecomponents of a hybrid integrated circuit test system-hybrid integrated circuit testhardware test board design. The third chapter focuses on the design of the test boardhardware platform, including hybrid integrated circuits to test the use of digital captureinstrument (DCI), analog capture instrument (ACI), a programmable power supplydesign, high-precision analog measuring instrument design. Chapter IV in detailintroduces FPGA logic design for hybrid integrated circuit testing, the tester chip logiccontrol design, including the control of the digital-to-analog capture chip, precision measurement unit control, programmable power supply control and memory read andwrite control. And including the logical design of the decoding and encoding of testvectors.Finally,giving a typical hybrid integrated circuit digital-to-analog converter(DAC) to illustrate the practical application of the test board circuit.Test the ADC staticparameters by selecting the highest frequency of testing,and get the test results of themain performance parameters of the chip, in accordance with DUT device manual bookindex,and all the requirements have been adopted, which means that we have developeda hybrid integrated circuit automatic test system to meet the expected need.

Related Dissertations

  1. Embedded flash memory testing technology,TP333
  2. Research and improvement of high-precision D / A data conversion chip test method,TN792
  3. The PAS platform PDK package development and analysis,TN402
  4. Application Software Design of Test System for Digital Circuit Board,TN79
  5. Research and Realization on the Generating Method of Test Vectors of Micro-Controler,TN407
  6. Analysis on Monetary Policy’s Validity under Inflation Contrast to Deflation,F820
  7. Genetic algorithms in VLSI design automation,TN402
  8. Research on a Chip-MultiProcessor Architecture and the Way of Developing Test Vector,TP332
  9. SAT-based Automatic Test Pattern Generation of VLSI,TN402
  10. Automated fault simulation process development,TN407
  11. The Research of How To Improve the Test Coverage by Boundary-scan Test Vendor,TP274
  12. 8-bit MCU Design Verification and Test Vector Fault Coverage Analysis,TP368.11
  13. Radio frequency identification system and data security research,TP391.4
  14. Exploration of Boundary Scan Application in In-Circuit Test of Circuit Pack,TN407
  15. Automatic Test Pattern Generation and the Functionality Verification Environment,TP311.52
  16. The Behavioral Level Design and Mixed-Signal Simulation of Analog and Mixed-Signal Integrated Circuits,TN45
  17. Research of Substrate Noise Coupling in Mixed-Signal IC’s,TN45
  18. Hybrid integrated circuit design for testability,TN45
  19. Anti-static protection for mixed analog-digital integrated circuits,TN45
  20. Design, Routing and Optimization of Clock Distribution Networks for Deep Submicron Integrated Circuit,TN45
  21. FDTD microwave circuit,TN45

CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > Hybrid integrated circuits
© 2012 www.DissertationTopic.Net  Mobile