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Embedded flash memory testing technology

Author: RenDongLiang
Tutor: XiaoPengCheng
School: Fudan University
Course: Electronics and Communication Engineering
Keywords: Embedded flash memory testing Test vectors Stability tests Testing costs Test time
CLC: TP333
Type: Master's thesis
Year: 2011
Downloads: 49
Quote: 1
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Abstract


All week, the memory chip itself on the fierce market competition, the majority of domestic chip manufacturers (FAB) all have the ability to manufacture memory chips from the current trend, the test is the most critical factor affecting the price one, so how to reduce the cost of test is a need long-term attention. But also need to take into account to improve test efficiency and test reliability. The author's company mainly produces 0.13μm technology embedded flash (E-Flash), combined with routine testing of embedded flash memory chips, and auxiliary process integration and device design department personnel department on embedded flash (E-Flash) for improvement , and obtained a great deal of engineering test data. The new design of the circuit and process parameters and functional test checks that this subsection embedded flash IP module parameter index eventually meet all the expectations and to meet production needs, and draw a lot of new testing methods. First, the combination of circuit design, citing a variety of BIST (Built-in Self-test, built-in self test circuit) design features, limiting the number of chip pins, the main pin functions as well as various circuit designs brought to the test to the advantages and disadvantages. According to the actual needs, provide the best testing program, but also mentioned some of the commonly used test methods and test parameters, and its analysis and research, which enables us to understand the methods and parameters to test the interaction that exists between restrict the role of the relevant defect inspection results and make up approach. Secondly, with the device operating characteristics, in particular the work of embedded flash write characteristics of the focus. From theory to practice, to borrow the traditional testing methods, try adjusting some parameters, and constantly improve the stability and expansion of the device operating parameters of the normal work area, and ultimately achieve the purpose of effectively improve the yield. Again, the combination of mass production in the engineering improvements for optimizing testing procedures needed to shorten the test time, optimize the testing process and improve the test coverage problem and come up with a complete set of test methods and means of verification. Finally, although this article outlined the most practical engineering problems have been basically solved, but the author of these issues using the extension and expansion of research and engineering, to prove and need to be further optimized. At the same time, these studies of the memory chip testing research has certain reference, the same scenario can be helpful in the future.

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CLC: > Industrial Technology > Automation technology,computer technology > Computing technology,computer technology > Electronic digital computer (not a continuous role in computer ) > Memory
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