Dissertation > Excellent graduate degree dissertation topics show

QFN packages are based on Class D audio amplifier test

Author: HuangYing
Tutor: WangYiWen;CaoLiQiang
School: University of Electronic Science and Technology
Course: IC Engineering
Keywords: QFN Assembly Classs-D audio amplifier test board IC test
CLC: TN722.75
Type: Master's thesis
Year: 2011
Downloads: 24
Quote: 0
Read: Download Dissertation

Abstract


Testing is to delete design bad product to avoid both the time and cost waste if directly application on Pcb., for consumer electronic products it is indispensable. With the continuous improvement of the performance, in the chip from wafer to finished products in the process, the technology level also needs further improve, testing as a final and very key step must also get corresponding improvement. Different from other package form of testing, a device based on QFN package has its unique test method.This topic is from Shanghai Chiphomer microelectronics Crop. they full entrust SMIC to do the assembly and test for their device CP2230QN which designed by themselves. For the testing, request to design and develop all the hardware and software, and need to mass production. Product test engineering department will finish all the design of hardware and software,then base on software and hardware to debug test parameter,until this device put into mass production smoothly. Main job include the following aspects:1.Used kelvin test with four line,used convenient Altium Design tool to complet the test circuit board Design and production, including test Principle drawing and test circuit wiring, the board and to be processing.2.The sourse boards of AST2000 tester system are studied in detail and sourse boardapplication is investigated in detail in the debugging3.The product datasheet and test specification are investigated in detail, the test principle and test method for every test parameters are studied, also the effects of test sequence is considered in detail4.The issues and solutions in debugging are analysed in detail.5.The data differentces between theoretics and practice are analysed in detail, also the importance of data consistency and repetition in mass production are analysed in detail.In the meantime emphatically resolve the actual test circuit interference, bad shielding, the contact problem,the unstable value of test parameters and bad precision , especially in the test parameters such as THD are particularly outstanding. The smooth completion of the project design, guarantee the products in quantity during parameters of no more than 2% difference, and ensure high quality products performance at the same time, improve product test yield, let the customer’s products better and faster more invest to market, supply the fast growth of market demand.

Related Dissertations

  1. Research on JIC Test Method and Failure Assessment of a Shipbuilding Steel Welded Structure,U671.8
  2. High-power analog integrated circuits DC parametric test and Implementation,TN431.1
  3. Power QFN Switch IC Packaging Process and Its Reliability Study,TN405
  4. Study of Close Power Transmission Experiment Device and Speed Reducer Power Effeciency Measurement Method,TH132.425
  5. Digital IC tester channel circuit design,TN407
  6. Study on Current Based Testing Technology for Digital Integrated Circuits,TN407
  7. Field Strain Test, Static Analysis and Dynamic Analysis of TianJin Museum Long-span Reticulated Shell,TU399
  8. USB-based hardware and software co-verification platform design,TN407
  9. Efficient ATE test of mixed-signal test solution,TM935
  10. The ICs’ Test Method Analysis and Simulate Realization,TN407
  11. Test of Integrate Circuit & Test Research of PCU06ESP,TN407
  12. The Study and Realization of Retest Rate Reduction in Semiconductor Industry,TN307
  13. Research on Very Short Reach Optical Transmission System,TN929.11
  14. FPGA-based PCI bus interface controller design,TP273.5
  15. The Design of Hall IC and the R&D of Hall Sensor Testing Apparatus,TP212
  16. The Research of Fractional-N Frequency Synthesizer Testing Technique,TN74
  17. SH2000 PCI driver IC test system and PC software development,TN407
  18. High Speed Integrated Circuits Device under Test Board Simulationand Design,TN407
  19. Based on a single measurement point Analog IC Test System Design,TN431.1
  20. S-Band RF Power Amplifier Design Method,TN722.75
  21. Research of Wide Dynamic Range Transmitter,TN722.75
  22. Efficient Power Amplifier Technology and Research,TN722.75

CLC: > Industrial Technology > Radio electronics, telecommunications technology > Basic electronic circuits > Amplification technology,the amplifier > Amplifier > Amplifiers: the role of sub- > Power amplifier
© 2012 www.DissertationTopic.Net  Mobile