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Digital IC tester channel circuit design
Author: HaoYeJun
Tutor: ZhanHuiQin
School: University of Electronic Science and Technology
Course: Measuring Technology and Instruments
Keywords: Automatic Test IC Test Functional Test DC parametric tests Field Programmable Gate Array
CLC: TN407
Type: Master's thesis
Year: 2011
Downloads: 87
Quote: 1
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Abstract
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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Testing and inspection
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