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Σ △ ADC digital filter circuit and jitter circuit design
Author: ShengKaiYi
Tutor: XuJun;ZengXiaoJun
School: Fudan University
Course: Electronics and Communication Engineering
Keywords: Σ △ ADC Oversampling Noise shaping Digital decimation filter Shake Platform area
CLC: TN792
Type: Master's thesis
Year: 2010
Downloads: 162
Quote: 0
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Abstract
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Multiple ADC implementation methods , Σ △ ADC based on high resolution , good linearity , and the advantage of easy integration with digital systems are widely used in the field of audio and electronic measurement . Traditional Nyquist - type ADC in a standard CMOS process , the conversion accuracy can be achieved is limited by the matching of the component accuracy is difficult to obtain high accuracy. Σ △ ADC uses the oversampling technique , and for shaping the quantization noise , and can effectively attenuate the output signal of the in-band quantization noise, and to improve the signal - to - noise ratio in the output band , makes use of low-accuracy converter mold with high accuracy A / D conversion possible. Compared with Nyquist type ADC , Σ △ ADC reduce the higher requirements of precision components match and try to improve the accuracy of the pressure shifted to the digital processing chain , to take full advantage of faster and faster declining cost of digital circuits development trend. Σ △ ADC mainly of a modulating portion and a digital decimation filter consisting of two parts . Σ △ ADC basic principle on the basis of the study design of the digital decimation filter , and select the structure of the battery measured . Taking into account the design requirements for battery measurement system : ( 1) multi-channel monitoring : voltage channel temperature channel and the current channel ; ( 2 ) low-cost , low-power , high-precision ; (3 ) channel input approximate DC signal. Smaller cost consideration in the design , add jitter (Dither) technology to effectively reduce the near - DC signal measurement platform area (flat-zone) phenomenon . Σ △ ADC voltage channel , this design temperature channel measurement range is 0 ~ 5V, the accuracy is 12 ; measuring range of the current channel is - 64mv - 64mv accuracy is 14 . The chip tapeout Vangard 0.5um process chip test results show that the performance of the ADC to achieve the design is expected indicators .
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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Basic electronic circuits > Digital circuits > Digital-analog , digital to analog conversion circuit
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