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Scan Test and Build-In Self Test on MCU IC

Author: MaHuiYan
Tutor: LiuKaiHua；SongGuoLan
School: Tianjin University
Course: Electronics and Communication Engineering
Keywords: Chip testing Final test Built - in self-test Scan Test Microcontrollers Vector file
CLC: TN407
Type: Master's thesis
Year: 2007
Downloads: 71
Quote: 1
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Abstract


Integrated circuit technology and the rapid development of the test to become a part of the most labor-intensive , time and financial resources throughout the design life cycle of the IC . Traditional testing technology is based on a modular design concept for the integrated circuit chip for functional test , did not give much thought to the problem of testing in the beginning of the chip design . With the circuit complexity increases and design technology continues to advance , the shrinking process dimensions , testing techniques are more and more challenges . Especially since entering the stage of development of the high level of integration and deep sub-micron , the manufacturers by integrating IP core system-level integrated circuits more powerful , increasing the complexity of the product , the increasingly shortening of the product life cycle , the demand of the major manufacturers increased competition and the market price of demand and so gave the test and design bring new challenges and problems , increase the difficulty for the test . So , the industry began to explore the convenience in the design of the test method . Ever since the Design for Test and Design for FA also came into being . This paper will focus on the Design for Test, Design for Test Test Method for the industry is relatively popular in-depth research . The same time , the different stages of chip production , including : chip manufacturing , chip-level testing , sliced ??package , aging , and the final test until the end customers . Chip-level test and final test is the focus of discussion of this topic on the test method . Based on Freescale 's IC products based on Freescale S08R series microcontrollers and application in the actual production of scan test and built-in self- test technology comprehensively and systematically explained . With the help of a block diagram structure due to the confidentiality requirements of the company's software , for the composition and structure of the test software to introduce . Teradyne J750 test system as a platform for the software . After a rigorous specification of the software to detect and tight commissioning and commissioning process , eventually be applied in the normal production . The study makes Freescale the STAR08 R Series MCU final scan test and built-in self- test . Tens of thousands of IC products have been successfully applied in the final customers in the consumer electronics . Production effectiveness and customer response to product quality is good .

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CLC: > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Testing and inspection
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