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Optical properties of metal - based thin - film structure

Author: DaiZhongHong
Tutor: ChenLiangYao
School: Fudan University
Course: Optics
Keywords: Precious metal film Zinc oxide films Negative refractive index Spectroscopic ellipsometry Optical constants Snell's law
CLC: O484.41
Type: Master's thesis
Year: 2009
Downloads: 102
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Abstract


This paper mainly studied the optical properties of the structure of the base film of a metal such as precious metals and metal oxides. Observed in recent years microstructure of metal-based artificial boundary negative refraction phenomenon and its research progress in the system description. In order to understand the role of the precious metals in this structure, it is necessary to isolate other complex secondary effects, and conducted a detailed study of the optical frequency electromagnetic propagation characteristics in the most simple and natural metal interface. Snell's law-based experimental framework, by RF sputtering method in the study prepared by the the series precisely controlled wedge angle of incidence of precious metals gold, silver and copper samples. Work selected at 473 nm, 532 nm, 632.8 nm and 780 nm, four kinds of representative of the laser light source and the optical path amplification principle tiny angle of refraction with the variation of the wavelength and the angle of incidence measurement and research, to design a light from wedge bottom side of the metal sample vertically incident light path structure, occurs when the light propagation in the most simple the natural noble metal interface, from negative to positive refractive characteristics quantitative experimental measurements obtained apparent refractive index with the change of incidence and refraction Quantitative relationships found apparent negative refractive index in the precious metals group (gold, silver, copper) interface, detailed exploration and discussion of the singular light refraction phenomena controversial mechanism that this plasma and negative permeability and Goos-H (a | ยจ) nchen effect unrelated. Metal-based oxide structure in recent years, causing extensive academic interest and importance to be in-depth study, the zinc oxide material due to its excellent optical performance and application prospects become the hotspot of today's scientific research. As a non-contact, non-destructive measurement method, the modern spectroscopic ellipsometry measurements are widely used in industrial production and scientific research. Therefore, in the paper, on the one hand, based on the Fresnel optical principles the oval spectroscopy and its mode described, at the same time on the basis of analysis and using a variety of different dispersion models and effective medium model, prepared by ECR-PLD method ellipsometric spectra having a different micro-structure of the ZnO film was analyzed, to obtain the spectrum of the optical constants of the film state ZnO. Further analysis revealed that, for different microscopic structure of ZnO films, the appropriate choice of the dispersion model analysis of spectral ellipsometry, optical properties of metal oxide film than a true reflection of state. The work and the results of this study will help people to understand and recognize the propagation characteristics of the light metal matrix microstructure and law, as well as a better understanding of the optical properties of the zinc oxide material, which established for the development and application of new optoelectronic materials and devices foundation.

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CLC: > Mathematical sciences and chemical > Physics > Solid State Physics > Thin Film Physics > The nature of the films > Optical Properties
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