Dissertation > Excellent graduate degree dissertation topics show
Efficient ATE test of mixed-signal test solution
Author: XiongZuo
Tutor: GuoZuo;LiFan
School: Shanghai Jiaotong University
Course: Software Engineering
Keywords: IC Test Solution Mixed Signal Device Automatic Test Equipment Multi-site Testing
CLC: TM935
Type: Master's thesis
Year: 2008
Downloads: 5
Quote: 0
Read: Download Dissertation
Abstract
|
As the semi-conductor technology developing continuously and the market grow towards mature every day, the competition within devices of similar functions becomes ever fierce. Inevitably the cost control becomes more and more important. Testing is a major cost among all costs, therefore high-efficient ATE test solutions, plays a very important role in winning the market.Mixed signal test is commonly known as a time-consuming, parallel-incompatibility and noise-sensitive. In this paper the author will introduce a new mixed signal test solution through a project called“Lion”based on J750 ATE platform。The author will show that how the traditional PLL test and DAC test is improved by J750 test solution and how much time is saved as per this new generation ATE, as well as the improvement on test stability. This paper will also cover related PCB design technique of this new multi-site mixed-signal test solution。This new solution can provide great help for similar test projects.
|
Related Dissertations
- Design of Testing Equipment for Electronic Products,TN06
- A frequency-hopping transceiver to achieve automatic detection system,TN859
- The Automatic Test Equipment for Motor Drive with Portable,TM306
- Develop One ATE for CMOS Image Sensor,TP274
- The Investigation and Resolving of Unstable Reading Problem of NOR Flash Memory,TN407
- DSP-based Circuit Fault Diagnosis System Research and Development,TN710
- The Research of Fractional-N Frequency Synthesizer Testing Technique,TN74
- Quad-core microprocessor test Method,TP332
- Research on General Calibration Technology for Automitic Test Equipment,TP274
- Research on Simulation for Radar Clutter and Automatic Test Method for Circuit Board,TN955
- CADC Universal Test System Development,TP274
- ATE8000 automatic test system master software design and implementation,TP311.52
- ATE Software Testing Methods and Implementation,TP311.5
- The ATE software testing strategies and case studies,TP311.52
- Based on IEEE1445 standards Circuit Fault Diagnosis Research and Implementation,TN707
- Structural Analysis and Test Data Optimization of ATE Systems,TN407
- The Driver and Auto-Testing Apparatus for Temperature Characteristics of Vcsel,TN248
- Research of Data Acquisition and Processing System Based on Automatic Test Equipment of AMU,V241.06
- Computer hardware circuit design for testability and automatic test to achieve,TP331
- Advanced aircraft power distribution terminal automatic test equipment development,TP29
CLC: > Industrial Technology > Electrotechnical > Electrical measurement techniques and instruments > Frequency, waveform parameter measurement and instrumentation
© 2012 www.DissertationTopic.Net Mobile
|