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Trace impurities in high purity alumina standard analysis method

Author: YouYuPing
Tutor: RenFengLian;ZhangShuChao
School: Central South University
Course: Analytical Chemistry
Keywords: high-purity aluminum oxide spectrophotometry microwave digestion inductively coupled plasma atomic emission spectrometry
CLC: O614.31
Type: Master's thesis
Year: 2005
Downloads: 327
Quote: 1
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Abstract


Recently, high-purity aluminum oxide has been widely used as translucent ceramic materials, single crystal materials and rare earth fluorescent materials because of its mechanical, thermal, chemical properties. Since the purity of the high-purity aluminum oxide can significantly affect the resultant microstructure, and thus the quality of the products, it is very important to determine and control the content of impurities in aluminum oxide. Though high-purity aluminum oxide was brought about ten years ago in our country, it is still difficult to determine the impurities because there are no corresponding standards of industry and nation. With the development of science and technology, high-purity aluminum oxide will be in great demand, and higher purification will be required as well. Therefore, it is very urgent to establish a series of analytical method for determining impurities in aluminum oxide.High-purity aluminum oxide is one of the hardest melting materials. Microwave-assisted acid dissolution of high-purity aluminum oxide has been developed for pretreatment in specimen, which decreases blank value, avoids of volatilization of trace element, and saves time, compared with traditional fusion with sodium carbonate/boric acid.Spectrophotometer plays an important role in metallurgical analysis because of its simpleness, convenience and nicety. And extraction, as an important method of separation and enrichment, which combined with spectrophotometric analysis, is very efficiency. Thus two methods to respectively determine Fe2O3 、 SiO2 in high-purity aluminum oxide by extractive spectrophotometry have been developed.Inductively coupled plasma atomic emission spectrometry (ICP-AES) has become a comprehensive method in the trace component analysis, because of low detection limits, rapid analysis and good sensitivity. In this work, a method has been investigated by ICP-AES for analyzing impurities in High-purity aluminum oxide. In the total, a method only for Fe、 Si、 Ca、 Na has been established.

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CLC: > Mathematical sciences and chemical > Chemistry > Inorganic Chemistry > Metal elements and their compounds > Section III group metal elements and their compounds > Aluminum Al
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