Test Data Compression - Dissertation

About 30 item dissertation in line with Test Data Compression query results,the following is 1 to 50(Search took 0.070 seconds)

Research on Test Data Compression Coding Method for Integrated Circuit,MaHui/Hunan University,0/2
Low-cost and-power Test for Digital Circuits,WangWeiZheng/Hunan University,0/94
The Research of Test Data Compression Method Based on Compatibility Analysis,LiuJun/Hefei University of Technology,0/18
Research on Test Vectors Compression Based on Run-length Coding,LiYuan/Hunan University,0/28
Research on Data Compression and Low Power Dissipation Techniques in SoC Test,ShangJin/Harbin University of Science and Technology,0/95
Research on Built-off Self-Test for System-on-a-Chip,ZhanWenFa/Hefei University of Technology,3/152
The Research of SoC Test Data Compression Based on Multiple Features Sequence Coding,YuJian/Hefei University of Technology,0/50
The Research of SoC Test Data Compression Based on Data Block Coding,ChengLiLi/Hefei University of Technology,1/81
Research on LFSR Reseeding Method Based on Test Date Compression of Partial Compatibility,WuXiaoYin/Hefei University of Technology,0/51
Test Data Compression Based on Blocks’ Compatibility of Responses and Group-Frequency Encoding,YeYiQun/Hefei University of Technology,0/42
The Test Data Compression of System-on-a-Chip (SoC) Based on Dimidiate Partition and Packet-sharing,ZhangNian/Hefei University of Technology,0/39
Grouped based on the extended prefix and SoC test data compression coding method,ShiFeng/Hefei University of Technology,2/60
Research on Test Data Partition Compression of System-on-Chip,TaoZuoHui/Hefei University of Technology,0/117
The Research of SoC Test Data Compression Method Based on Test Resource Partition,XiaoZhuHong/Hefei University of Technology,2/78
The Research on Test Data Compression of Digital System by Coding,ZhangLei/Hefei University of Technology,0/111
The Research of Test Data Compression Based on Multiple Scan Chains,XuYuJuan/Hefei University of Technology,2/100
The Research on Test Data Compression of System-on-a-Chip (SoC),YuJing/Hefei University of Technology,4/148
The Research of Test Data Compression Based on Coding and Reseeding Techniques,SunChaoChao/Hefei University of Technology,1/53
Test Data Generation Based on Evolutionary Testing and Data Compression in HDL Circuit,JinWenHui/Xi'an University of Electronic Science and Technology,0/23
Research on Test Data Compression Technology Based on SoC,JiaYanHong/Harbin Engineering University,1/56
The Research of SoC Test on Variable Length Coding,WangBaoQing/Hefei University of Technology,2/33
Research on Test Data Compression of SoC Based on Power Division and Block Coding,XuSanZi/Hefei University of Technology,0/38
The Research of SoC Test Data Compression Method Based on Partial Reusing and Statistic Coding,HuangXiE/Hefei University of Technology,1/30
Research on Test Data Compression for SoC,LuoQiang/Hefei University of Technology,2/39
The Research of SoC Test Data Compression Method Based on Huffman Coding,ZouBaoSheng/Hefei University of Technology,2/103
Research on SoC Test Data Compression Based on Partition Coding,LiJianXin/Hefei University of Technology,0/29
Research on Test Data Compression of SoC Based on State Correlativity and Power Division,MaoWei/Hefei University of Technology,0/24
SoC Test Data Compression Method,ZhuZuoWei/Fudan University,0/80
Research and Simulation Test of Data Compression Base on LFSR Reseeding,YiLin/Harbin University of Science and Technology,0/17
Research on SoC Test Optimization and Application Technology,XiangGang/Harbin Institute of Technology,1/59