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Phase-locked loop can be widely used because of its unique excellent performance, the use of which has a high stability frequency oscillation, monitoring, tracking and control and other features can be made of high-performance frequency synthesizer, precision oscillation, modulation and demodulation frequency and control circuitry. The current rapid development of integrated phase-locked loop route to its low cost, good performance, easy to use, widely used, has become a frequently used in the electrical engineering a multifunctional component. The main subject of National Semiconductor's LM2433, for example phase-locked loop frequency synthesizer test methods. LMX2433 phase-locked loop operating voltage range of 2.25V to 2.75V, 3.6GHz RF frequency operation, and supports 1.7GHz IF supply current of 7.0mA, are free to choose synchronous or asynchronous shutdown mode, programmable charge pump current of 1 mA or 4 mA, built-in time-out counter quickly lock (Fastlock) technology, digital filtered lock the detection output 1.8VMicrowire logic circuit interface, 16/17 modulus prescaler to choose from. LM2433 phase locked loop during the test using the test machine is from LTX Fusion CX testing machine. The Fusion CX automatic test equipment system available is a user-configurable, modular semiconductor chip testing systems, is also widely used in the industry. Users can develop test machine configuration according to their different needs, in order to achieve cost savings, maximize the improvement of the utilization of the test machine. Mainly from the following aspects to discuss LM2433 phase locked loop test method, the second chapter introduces the LM2433 phase locked loop and indicators. . Chapter LTX Fusion CX testing machine and the operating principle and parameters. Chapter introduces the LM2433 DC test of the phase-locked loop, which describes in detail the the test initialization tests, Open and short circuit testing and input and output high and low test. Chapter discuss and study functional testing, functional testing is very important for LM2433 phase locked loop. Chapter detailed discussion of the phase-locked loop the related special test methods, high-frequency test to pay attention to the problem. In Chapter 7, we studied the results of the test data, and given the direction of the optimization. Chapter VIII, we conducted Summary and Outlook. After my team debugging, the LMX2433 testing procedures and programs have been applied to the production, testing yield has reached more than 95%, to meet the requirements of supply to customers' samples. Wherein the failure in that the functional testing, primarily associated with the wafer itself. I will continue to monitor the proportion and distribution of the failure of the device, in order to further optimization of the test program.
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